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Advances in Degradation Modeling (Statistics for Industry and Technology)

N. Balakrishnan

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This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. Additional topics covered include accelerated testing and inference, step-stress testing and inference, nonparametric inference, model validity in accelerated testing, the point process approach, bootstrap methods in degradation analysis, exact inferential methods in reliability, dynamic perturbed systems, and degradation models in statistics. Advances in Degradation Modeling is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.

Language: English

Pages: 416

Format: Kindle Edition

Publisher: Birkhäuser Boston

Release: July 08, 2010

Advances in Degradation Modeling (Statistics for Industry and Technology)

N. Balakrishnan

0/5 ( ratings)

This volume is a collection of invited chapters covering recent advances in accelerated life testing and degradation models. The book covers a wide range of applications to areas such as reliability, quality control, the health sciences, economics and finance. Additional topics covered include accelerated testing and inference, step-stress testing and inference, nonparametric inference, model validity in accelerated testing, the point process approach, bootstrap methods in degradation analysis, exact inferential methods in reliability, dynamic perturbed systems, and degradation models in statistics. Advances in Degradation Modeling is an excellent reference for researchers and practitioners in applied probability and statistics, industrial statistics, the health sciences, quality control, economics, and finance.

Language: English

Pages: 416

Format: Kindle Edition

Publisher: Birkhäuser Boston

Release: July 08, 2010

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